Investigation of surface recombination and carrier lifetime in 4H/6H-SiC

Galeckas, A. / Linnros, J. / Frischholz, M. et al. | British Library Online Contents | 1999

Wafer Level Recombination Carrier Lifetime Measurements of 4H-SiC PiN Epitaxial Wafers

Chung, G.Y. / Loboda, M.J. / MacMillan, M.F. et al. | British Library Online Contents | 2009

Correlation between Carrier Recombination Lifetime and Forward Voltage Drop in 4H-SiC PiN Diodes

Chung, G.Y. / Loboda, M.J. / Sundaresan, S.G. et al. | British Library Online Contents | 2010

The Effect of Growth Conditions on Carrier Lifetime in n-Type 4H-SiC Epitaxial Layers

Lilja, L. / Hassan, J. / Booker, I.D. et al. | British Library Online Contents | 2012

Extraction of the carrier generation and recombination lifetime from the forward characteristics of advanced diodes

Poyai, A. / Simoen, E. / Claeys, C. et al. | British Library Online Contents | 2003