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Effect of Surface and Interface Recombination on Carrier Lifetime in 6H-SiC Layers
Effect of Surface and Interface Recombination on Carrier Lifetime in 6H-SiC Layers
Effect of Surface and Interface Recombination on Carrier Lifetime in 6H-SiC Layers
Sun, J.W. (author) / Kamiyama, S. (author) / Yakimova, R. (author) / Syvajarvi, M. (author) / Lebedev, A.A. / Davydov, S.Y. / Ivanov, P.A. / Levinshtein, M.E.
2013-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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