Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Growth of 4H-SiC epilayers with low surface roughness and morphological defects density on 4^o off-axis substrates
Growth of 4H-SiC epilayers with low surface roughness and morphological defects density on 4^o off-axis substrates
Growth of 4H-SiC epilayers with low surface roughness and morphological defects density on 4^o off-axis substrates
APPLIED SURFACE SCIENCE ; 270 ; 301-306
01.01.2013
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Improvement of Surface Roughness for 4H-SiC Epilayers Grown on 4^o Off-Axis Substrates
| British Library Online Contents | 2010
AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates
| British Library Online Contents | 2014
AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates
| British Library Online Contents | 2014
Comparative Study of Defects in 4H-SiC Epilayers Grown on 4^o Off-Axis (0001) and (000-1) Substrates
| British Library Online Contents | 2014
GaN epilayers on misoriented substrates
| British Library Online Contents | 1999