Light-induced enhancement of the minority carrier lifetime in boron-doped Czochralski silicon passivated by doped silicon nitride

Wang, H. / Chen, C. / Pan, M. et al. | British Library Online Contents | 2015

In situ bulk lifetime measurement on silicon with a chemically passivated surface

Horanyi, T. S. / Pavelka, T. / Tuettoe, P. | British Library Online Contents | 1993

Minority carrier lifetime and metallic-impurity mapping in silicon wafers

Palais, O. / Martinuzzi, S. / Simon, J. J. | British Library Online Contents | 2001

Mapping of minority carrier lifetime and mobility in imperfect silicon wafers

Palais, O. / Clerc, L. / Arcari, A. et al. | British Library Online Contents | 2003

Implications of alkaline solutions-induced etching on optical and minority carrier lifetime features of monocrystalline silicon

Bachtouli, N. / Aouida, S. / Laajimi, R. H. et al. | British Library Online Contents | 2012