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Electronic properties of epitaxial graphene residing on SiC facets probed by conductive atomic force microscopy
Electronic properties of epitaxial graphene residing on SiC facets probed by conductive atomic force microscopy
Electronic properties of epitaxial graphene residing on SiC facets probed by conductive atomic force microscopy
Giannazzo, F. (Autor:in) / Deretzis, I. (Autor:in) / Nicotra, G. (Autor:in) / Fisichella, G. (Autor:in) / Spinella, C. (Autor:in) / Roccaforte, F. (Autor:in) / La Magna, A. (Autor:in) / Molle, A. / Dimoulas, A. / Le Lay, G.
01.01.2014
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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