Nanoscale Electrical Characterization of 3C-SiC Layers by Conductive Atomic Force Microscopy

Yahata, A. / Zhang, L. / Shinohe, T. | British Library Online Contents | 2002

Electrical characterization of grain boundaries of CZTS thin films using conductive atomic force microscopy techniques

Muhunthan, N. / Singh, Om Pal / Toutam, Vijaykumar et al. | British Library Online Contents | 2015

Formation of epitaxial gamma-FeSi~2 and -FeSi~2 layers on (III)Si

Grimaldi, M. G. / Franzo, G. / Ravesi, S. et al. | British Library Online Contents | 1994

Electronic properties of epitaxial graphene residing on SiC facets probed by conductive atomic force microscopy

Giannazzo, F. / Deretzis, I. / Nicotra, G. et al. | British Library Online Contents | 2014

Electrical anisotropy properties of ZnO nanorods analyzed by conductive atomic force microscopy

Wu, Y. / Yu, N. / Liu, D. et al. | British Library Online Contents | 2013