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AFM and Ellipsometry Studies of Ultra Thin Ti Film Deposited on a Silicon Wafer
AFM and Ellipsometry Studies of Ultra Thin Ti Film Deposited on a Silicon Wafer
AFM and Ellipsometry Studies of Ultra Thin Ti Film Deposited on a Silicon Wafer
Lin, B.J. (Autor:in) / Zhu, H.T. (Autor:in) / Tieu, A.K. (Autor:in) / Triani, G. (Autor:in) / Tieu, A.K. / Zhu, H. / Zhu, Q.
01.01.2014
10 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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