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Differences between GaAs/GaInP and GaAs/AlInP interfaces grown by movpe revealed by depth profiling and angle-resolved X-ray photoelectron spectroscopies
Differences between GaAs/GaInP and GaAs/AlInP interfaces grown by movpe revealed by depth profiling and angle-resolved X-ray photoelectron spectroscopies
Differences between GaAs/GaInP and GaAs/AlInP interfaces grown by movpe revealed by depth profiling and angle-resolved X-ray photoelectron spectroscopies
López-Escalante, M. C. (Autor:in) / Gabás, M. (Autor:in) / García, I. (Autor:in) / Barrigón, E. (Autor:in) / Rey-Stolle, I. (Autor:in) / Algora, C. (Autor:in) / Palanco, S. (Autor:in) / Ramos-Barrado, J. R. (Autor:in)
APPLIED SURFACE SCIENCE ; 360 ; 477-484
01.01.2016
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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