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Ultrathin SiO2 layer formed by the nitric acid oxidation of Si (NAOS) method to improve the thermal-SiO2/Si interface for crystalline Si solar cells
Ultrathin SiO2 layer formed by the nitric acid oxidation of Si (NAOS) method to improve the thermal-SiO2/Si interface for crystalline Si solar cells
Ultrathin SiO2 layer formed by the nitric acid oxidation of Si (NAOS) method to improve the thermal-SiO2/Si interface for crystalline Si solar cells
Matsumoto, Taketoshi (Autor:in) / Nakajima, Hiroki (Autor:in) / Irishika, Daichi (Autor:in) / Nonaka, Takaaki (Autor:in) / Imamura, Kentaro (Autor:in) / Kobayashi, Hikaru (Autor:in)
Applied surface science ; 395 ; 56-60
01.01.2017
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.44
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