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Interfacial microstructure evolution and shear behavior of Au–20Sn/(Sn)Cu solder joints bonded at 250°C
Interfacial microstructure evolution and shear behavior of Au–20Sn/(Sn)Cu solder joints bonded at 250°C
Interfacial microstructure evolution and shear behavior of Au–20Sn/(Sn)Cu solder joints bonded at 250°C
Liu, Wensheng (Autor:in) / Wang, Yikai (Autor:in) / Ma, Yunzhu (Autor:in) / Yu, Qiang (Autor:in) / Huang, Yufeng (Autor:in)
MATERIALS SCIENCE AND ENGINEERING A ; 651 ; 626-635
01.01.2016
10 pages
Aufsatz (Zeitschrift)
Unbekannt
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