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Interfacial microstructure evolution and shear behavior of Au–20Sn/(Sn)Cu solder joints bonded at 250°C
Interfacial microstructure evolution and shear behavior of Au–20Sn/(Sn)Cu solder joints bonded at 250°C
Interfacial microstructure evolution and shear behavior of Au–20Sn/(Sn)Cu solder joints bonded at 250°C
Liu, Wensheng (author) / Wang, Yikai (author) / Ma, Yunzhu (author) / Yu, Qiang (author) / Huang, Yufeng (author)
MATERIALS SCIENCE AND ENGINEERING A ; 651 ; 626-635
2016-01-01
10 pages
Article (Journal)
Unknown
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