Characterization of SiC Epitaxial Structures using High-Resolution X-Ray Diffraction Techniques

Huang, X. R. / Dudley, M. / Cho, W. et al. | British Library Online Contents | 2004

Analysis of X-Ray Diffraction Scans of Poorly Crystallized Semicrystalline Polymers

Murthy, N. S. | British Library Online Contents | 1997

Systems scans contact stress

British Library Online Contents | 2001

High-resolution X-ray diffraction studies of combinatorial epitaxial Ge (001) thin-films on Ge (001) substrates

Zhong, Y. / Chu, Y. S. / Collins, B. A. et al. | British Library Online Contents | 2007

Epitaxial stress study by large angle convergent beam electron diffraction and high-resolution transmission electron microscopy Moire fringe pattern

Pailloux, F. / Gaboriaud, R. J. / Champeaux, C. et al. | British Library Online Contents | 2000