Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Dispersion properties in the visible range of carrier concentration of topologically protected Bi1-xSex films revealed by spectroscopic ellipsometry
Dispersion properties in the visible range of carrier concentration of topologically protected Bi1-xSex films revealed by spectroscopic ellipsometry
Dispersion properties in the visible range of carrier concentration of topologically protected Bi1-xSex films revealed by spectroscopic ellipsometry
Zhang, Jin-Bo (Autor:in) / Zhang, Dong-Xu (Autor:in) / Zheng, Yu-Xiang (Autor:in) / Zhang, Rong-Jun (Autor:in) / Wang, Zi-Yi (Autor:in) / Yang, Shang-Dong (Autor:in) / Yang, Liao (Autor:in) / Zhao, Dong-Dong (Autor:in) / Wang, Song-You (Autor:in) / Chen, Liang-Yao (Autor:in)
Applied surface science ; 465 ; 532-536
01.01.2019
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.44
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