Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Self-focusing SIMS: A metrology solution to area selective deposition
Self-focusing SIMS: A metrology solution to area selective deposition
Self-focusing SIMS: A metrology solution to area selective deposition
Spampinato, Valentina (Autor:in) / Armini, Silvia (Autor:in) / Franquet, Alexis (Autor:in) / Conard, Thierry (Autor:in) / van der Heide, Paul (Autor:in) / Vandervorst, Wilfried (Autor:in)
Applied surface science ; 476 ; 594-599
01.01.2019
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.44
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Self Focusing SIMS: Probing thin film composition in very confined volumes
| British Library Online Contents | 2016
Self Focusing SIMS: Probing thin film composition in very confined volumes
| British Library Online Contents | 2016
Selective area laser-induced deposition of rare earth hexaborides from solution
| British Library Online Contents | 1998
SIMS investigation of chemical solution-deposited SrTiO3/LaNiO3
| British Library Online Contents | 2001
The selective area deposition of diamond films
| British Library Online Contents | 1996