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Self Focusing SIMS: Probing thin film composition in very confined volumes
Self Focusing SIMS: Probing thin film composition in very confined volumes
Self Focusing SIMS: Probing thin film composition in very confined volumes
Franquet, A. (Autor:in) / Douhard, B. (Autor:in) / Melkonyan, D. (Autor:in) / Favia, P. (Autor:in) / Conard, T. (Autor:in) / Vandervorst, W. (Autor:in)
APPLIED SURFACE SCIENCE ; 365 ; 143-152
01.01.2016
10 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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