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Direct Investigation of Subsurface Interface Electronic Structure by Ballistic-Electron-Emission Microscopy

Kaiser, W. J. / Bell, L. D.

Abstract A new technique for spectroscopic investigation of subsurface interface electronic structure has been developed. The method, ballistic-electron-emission microscopy (BEEM), is based on scanning tunneling microscopy. BEEM makes possible, for the first time, direct imaging of subsurface interface properties with nanometer spatial resolution. We report on the first application of BEEM to subsurface Schottky- barrier interfaces.

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Direct Investigation of Subsurface Interface Electronic Structure by Ballistic-Electron-Emission Microscopy

Kaiser, W. J. / Bell, L. D.

Abstract A new technique for spectroscopic investigation of subsurface interface electronic structure has been developed. The method, ballistic-electron-emission microscopy (BEEM), is based on scanning tunneling microscopy. BEEM makes possible, for the first time, direct imaging of subsurface interface properties with nanometer spatial resolution. We report on the first application of BEEM to subsurface Schottky- barrier interfaces.

Direct Investigation of Subsurface Interface Electronic Structure by Ballistic-Electron-Emission Microscopy

Kaiser, W. J. / Bell, L. D.

Abstract A new technique for spectroscopic investigation of subsurface interface electronic structure has been developed. The method, ballistic-electron-emission microscopy (BEEM), is based on scanning tunneling microscopy. BEEM makes possible, for the first time, direct imaging of subsurface interface properties with nanometer spatial resolution. We report on the first application of BEEM to subsurface Schottky- barrier interfaces.

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Titel:

Direct Investigation of Subsurface Interface Electronic Structure by Ballistic-Electron-Emission Microscopy

Beteiligte:

Kaiser, W. J. (Autor:in) / Bell, L. D. (Autor:in)

Erschienen in:

Electronic Structure of Metal-Semiconductor Contacts ; 252-255

Perspectives in Condensed Matter Physics ; 4

Erscheinungsdatum:

01.01.1990

Format / Umfang:

4 pages

ISBN:

978-94-010-6780-5 , 978-94-009-0657-0

ISSN:

DOI:

https://doi.org/10.1007/978-94-009-0657-0_35

Medientyp:

Aufsatz/Kapitel (Buch)

Format:

Elektronische Ressource

Sprache:

Englisch

Schlagwörter:

Physical Review Letter , Tronic Property , 8EEM Spectrum , Tunnel Voltage , Subsurface Interface Physics , Physics, general , Surfaces and Interfaces, Thin Films , Physical Chemistry , Electrical Engineering , Condensed Matter Physics

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