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    Direct REM observation of structural processes on clean silicon surfaces during sublimation, phase transition and epitaxy

    New search for: Latyshev, A. V.
    New search for: Krasilnikov, A. B.
    New search for: Aseev, A. L.

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    Direct REM observation of structural processes on clean silicon surfaces during sublimation, phase transition and epitaxy

    New search for: Latyshev, A. V.
    New search for: Krasilnikov, A. B.
    New search for: Aseev, A. L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Direct REM observation of structural processes on clean silicon surfaces during sublimation, phase transition and epitaxy

    New search for: Latyshev, A. V.
    New search for: Krasilnikov, A. B.
    New search for: Aseev, A. L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Direct REM observation of structural processes on clean silicon surfaces during sublimation, phase transition and epitaxy

    Contributors:

    Latyshev, A. V. (author) / Krasilnikov, A. B. (author) / Aseev, A. L. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 60 ; 397

    Publication date:

    1992-01-01

    Size:

    397 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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