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Micronic n-channel MOSFET degradation under strong and short-time hot-carrier stress
Micronic n-channel MOSFET degradation under strong and short-time hot-carrier stress
Micronic n-channel MOSFET degradation under strong and short-time hot-carrier stress
Djahli, F. (author) / Plossu, C. (author) / Balland, B. (author)
1992-01-01
164 pages
Article (Journal)
Unknown
DDC:
620.11
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