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    Spectroscopic ellipsometric characterization of Si/Si~1~-~xGe~x strained-layer supperlattices

    New search for: Yao, H.
    New search for: Woollam, J. A.
    New search for: Wang, P. J.
    New search for: Tejwani, M. J.

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    Spectroscopic ellipsometric characterization of Si/Si~1~-~xGe~x strained-layer supperlattices

    New search for: Yao, H.
    New search for: Woollam, J. A.
    New search for: Wang, P. J.
    New search for: Tejwani, M. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Spectroscopic ellipsometric characterization of Si/Si~1~-~xGe~x strained-layer supperlattices

    New search for: Yao, H.
    New search for: Woollam, J. A.
    New search for: Wang, P. J.
    New search for: Tejwani, M. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Spectroscopic ellipsometric characterization of Si/Si~1~-~xGe~x strained-layer supperlattices

    Contributors:

    Yao, H. (author) / Woollam, J. A. (author) / Wang, P. J. (author) / Tejwani, M. J. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 63 ; 52

    Publication date:

    1993-01-01

    Size:

    52 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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