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Spectroscopic ellipsometric characterization of Si/Si~1~-~xGe~x strained-layer supperlattices
Spectroscopic ellipsometric characterization of Si/Si~1~-~xGe~x strained-layer supperlattices
Spectroscopic ellipsometric characterization of Si/Si~1~-~xGe~x strained-layer supperlattices
Yao, H. (author) / Woollam, J. A. (author) / Wang, P. J. (author) / Tejwani, M. J. (author)
APPLIED SURFACE SCIENCE ; 63 ; 52
1993-01-01
52 pages
Article (Journal)
Unknown
DDC:
621.35
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