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    Photoreflectance versus ellipsometry investigation of GaAs/Al~0~.~3Ga~0~.~7As MQW's

    New search for: Bellani, V.
    New search for: Borghesi, A.
    New search for: Geddo, M.
    New search for: Guizzetti, G.

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    Photoreflectance versus ellipsometry investigation of GaAs/Al~0~.~3Ga~0~.~7As MQW's

    New search for: Bellani, V.
    New search for: Borghesi, A.
    New search for: Geddo, M.
    New search for: Guizzetti, G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Photoreflectance versus ellipsometry investigation of GaAs/Al~0~.~3Ga~0~.~7As MQW's

    New search for: Bellani, V.
    New search for: Borghesi, A.
    New search for: Geddo, M.
    New search for: Guizzetti, G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Photoreflectance versus ellipsometry investigation of GaAs/Al~0~.~3Ga~0~.~7As MQW's

    Contributors:

    Bellani, V. (author) / Borghesi, A. (author) / Geddo, M. (author) / Guizzetti, G. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 63 ; 167

    Publication date:

    1993-01-01

    Size:

    167 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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