Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Investigation of the relaxation of excess carriers in SiGe-heterostructures by photothermal measurement

    New search for: Geiler, H. D.
    New search for: Kruegel, S.
    New search for: Nuetzel, J.
    New search for: Friess, E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Investigation of the relaxation of excess carriers in SiGe-heterostructures by photothermal measurement

    New search for: Geiler, H. D.
    New search for: Kruegel, S.
    New search for: Nuetzel, J.
    New search for: Friess, E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Investigation of the relaxation of excess carriers in SiGe-heterostructures by photothermal measurement

    New search for: Geiler, H. D.
    New search for: Kruegel, S.
    New search for: Nuetzel, J.
    New search for: Friess, E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Investigation of the relaxation of excess carriers in SiGe-heterostructures by photothermal measurement

    Contributors:

    Geiler, H. D. (author) / Kruegel, S. (author) / Nuetzel, J. (author) / Friess, E. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 63 ; 260

    Publication date:

    1993-01-01

    Size:

    260 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Low-temperature strain relaxation in SiGe/Si heterostructures implanted with Ge+ ions

    Avrutin, V. S. / Izyumskaya, N. F. / Vyatkin, A. F. et al. | British Library Online Contents | 2003

    Hole band nonparabolicity and effective mass measurement in p-SiGe/Ge heterostructures

    Rossner, B. / Batlogg, B. / von Kanel, H. et al. | British Library Online Contents | 2006

    Investigation of SiGe/Si - Heterostructures with High Resolution X-Ray Diffraction Methods

    Frohberg, K. / Wehner, B. / Trui, B. et al. | British Library Online Contents | 2000

    A study of the interaction of electron beam generated excess charge-carriers with a Si/SiGe/Si heterostructure

    Sieber, B. / Kittler, M. / Miri, A. et al. | British Library Online Contents | 1996

    Measurement of the Lifetime of Photo-Generated Free Carriers in SiGe Waveguides

    Trita, A. / Cristiani, I. / Degiorgio, V. et al. | British Library Online Contents | 2007

    Back to top