Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Investigation of SiGe/Si - Heterostructures with High Resolution X-Ray Diffraction Methods

    New search for: Frohberg, K.
    New search for: Wehner, B.
    New search for: Trui, B.
    New search for: Wolf, K.
    New search for: Paufler, P.
    New search for: Kuck, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Investigation of SiGe/Si - Heterostructures with High Resolution X-Ray Diffraction Methods

    New search for: Frohberg, K.
    New search for: Wehner, B.
    New search for: Trui, B.
    New search for: Wolf, K.
    New search for: Paufler, P.
    New search for: Kuck, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Investigation of SiGe/Si - Heterostructures with High Resolution X-Ray Diffraction Methods

    New search for: Frohberg, K.
    New search for: Wehner, B.
    New search for: Trui, B.
    New search for: Wolf, K.
    New search for: Paufler, P.
    New search for: Kuck, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Investigation of SiGe/Si - Heterostructures with High Resolution X-Ray Diffraction Methods

    Contributors:

    Frohberg, K. (author) / Wehner, B. (author) / Trui, B. (author) / Wolf, K. (author) / Paufler, P. (author) / Kuck, H. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 321/324 ; 457-462

    Publication date:

    2000-01-01

    Size:

    6 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Process control of Si/SiGe heterostructures by X-ray diffraction

    Ryan, T. | British Library Online Contents | 2001

    Investigation of the relaxation of excess carriers in SiGe-heterostructures by photothermal measurement

    Geiler, H. D. / Kruegel, S. / Nuetzel, J. et al. | British Library Online Contents | 1993

    p-channel SiGe heterostructures for field effect applications

    Whall, T. E. | British Library Online Contents | 1996

    Strain Engineering in Highly Mismatched SiGe/Si Heterostructures

    Isa, Fabio / Jung, Arik / Salvalaglio, Marco et al. | British Library Online Contents | 2017

    Structural characterization of highly boron doped SiGe/Si heterostructures

    Woitok, J. F. / Visser, C. C. / Scholtes, T. L. | British Library Online Contents | 2002

    Back to top