A platform for research: civil engineering, architecture and urbanism
Low-temperature strain relaxation in SiGe/Si heterostructures implanted with Ge+ ions
Low-temperature strain relaxation in SiGe/Si heterostructures implanted with Ge+ ions
Low-temperature strain relaxation in SiGe/Si heterostructures implanted with Ge+ ions
Avrutin, V. S. (author) / Izyumskaya, N. F. (author) / Vyatkin, A. F. (author) / Zinenko, V. I. (author) / Agafonov, Y. A. (author) / Irzhak, D. V. (author) / Roshchupkin, D. V. (author) / Steinman, E. A. (author) / Vdovin, V. I. (author) / Yugova, T. G. (author)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 100 ; 35-39
2003-01-01
5 pages
Article (Journal)
English
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Strain Engineering in Highly Mismatched SiGe/Si Heterostructures
British Library Online Contents | 2017
|Strain Relaxation and Induced Defects in SiGe Thin Films Grown on Ion-Implanted Si Substrates
British Library Online Contents | 2004
|Low-temperature strain relaxation in ion-irradiated pseudomorphic SiGe/Si structures
British Library Online Contents | 2002
|Strain relaxation of Ge-implanted silicon wafers
British Library Online Contents | 2006
|Study of SiGe Alloys with Different Germanium Concentrations Implanted with Mn and As Ions
British Library Online Contents | 2008
|