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Effects of deep levels and Si-doping on GaInP material properties investigated by means of optical methods
Effects of deep levels and Si-doping on GaInP material properties investigated by means of optical methods
Effects of deep levels and Si-doping on GaInP material properties investigated by means of optical methods
Liu, Q. (author) / Quedeweit, U. (author) / Scheffer, F. (author) / Lindner, A. (author)
1993-01-01
181 pages
Article (Journal)
Unknown
DDC:
620.11
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