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Effects of deep levels and Si-doping on GaInP material properties investigated by means of optical methods
Effects of deep levels and Si-doping on GaInP material properties investigated by means of optical methods
Effects of deep levels and Si-doping on GaInP material properties investigated by means of optical methods
Liu, Q. (Autor:in) / Quedeweit, U. (Autor:in) / Scheffer, F. (Autor:in) / Lindner, A. (Autor:in)
01.01.1993
181 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620.11
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