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Stress and Texture Analysis in Thin Films and Coatings by X-Ray Diffraction
Stress and Texture Analysis in Thin Films and Coatings by X-Ray Diffraction
Stress and Texture Analysis in Thin Films and Coatings by X-Ray Diffraction
Pina, J. C. P. (author) / Marques, M. J. (author) / dos Santos, J. M. M. (author) / Dias, A. M. (author) / Vilarinho, P. M.
2006-01-01
5 pages
Article (Journal)
English
DDC:
620.11
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