Recombination lifetime characterization and mapping of silicon wafers and detectors using the microwave photoconductivity decay (mPCD) technique: Fid-Bau Portal

Recombination lifetime characterization and mapping of silicon wafers and detectors using the microwave photoconductivity decay (mPCD) technique

Harkonen, J. / Tuovinen, E. / Li, Z. / Luukka, P. / Verbitskaya, E. / Eremin, V.

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Recombination lifetime characterization and mapping of silicon wafers and detectors using the microwave photoconductivity decay (mPCD) technique

Harkonen, J. / Tuovinen, E. / Li, Z. / Luukka, P. / Verbitskaya, E. / Eremin, V.

Recombination lifetime characterization and mapping of silicon wafers and detectors using the microwave photoconductivity decay (mPCD) technique

Harkonen, J. / Tuovinen, E. / Li, Z. / Luukka, P. / Verbitskaya, E. / Eremin, V.

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Check availability in my library

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Document information

Title:

Recombination lifetime characterization and mapping of silicon wafers and detectors using the microwave photoconductivity decay (mPCD) technique

Contributors:

Harkonen, J. (author) / Tuovinen, E. (author) / Li, Z. (author) / Luukka, P. (author) / Verbitskaya, E. (author) / Eremin, V. (author)

Published in:

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 9 ; 261-265

Publication date:

2006-01-01

Size:

5 pages

ISSN:

1369-8001

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.38152

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Ogita, Y. / Nakano, M. / Masumura, H. | British Library Online Contents | 1995

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Palais, O. / Martinuzzi, S. / Simon, J. J. | British Library Online Contents | 2001

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Palais, O. / Clerc, L. / Arcari, A. et al. | British Library Online Contents | 2003