3-D Mapping of Strain and Defects in a ZnSe Epilayer Using a Variable Energy Electron Beam: Fid-Bau Portal

3-D Mapping of Strain and Defects in a ZnSe Epilayer Using a Variable Energy Electron Beam

Trager-Cowan, C. / Paterson, A. M. / Martin, R. W. / O'Donnell, K. P.

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3-D Mapping of Strain and Defects in a ZnSe Epilayer Using a Variable Energy Electron Beam

Trager-Cowan, C. / Paterson, A. M. / Martin, R. W. / O'Donnell, K. P.

3-D Mapping of Strain and Defects in a ZnSe Epilayer Using a Variable Energy Electron Beam

Trager-Cowan, C. / Paterson, A. M. / Martin, R. W. / O'Donnell, K. P.

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Document information

Title:

3-D Mapping of Strain and Defects in a ZnSe Epilayer Using a Variable Energy Electron Beam

Contributors:

Trager-Cowan, C. (author) / Paterson, A. M. (author) / Martin, R. W. (author) / O'Donnell, K. P. (author) / Heinrich, H. / Mullin, J. B.

Published in:

II-VI Compounds and Semi-magnetic Semiconductors ; 163

MATERIALS SCIENCE FORUM

Publication date:

1995-01-01

Size:

163 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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