Defect Formation and Recombination Processes in p-Type Modulation-Doped Si Epilayers: Fid-Bau Portal

Defect Formation and Recombination Processes in p-Type Modulation-Doped Si Epilayers

Buyanova, I. A. / Chen, W. M. / Henry, A. / Ni, W. X. / Hansson, G. V. / Monemar, B.

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Defect Formation and Recombination Processes in p-Type Modulation-Doped Si Epilayers

Buyanova, I. A. / Chen, W. M. / Henry, A. / Ni, W. X. / Hansson, G. V. / Monemar, B.

Defect Formation and Recombination Processes in p-Type Modulation-Doped Si Epilayers

Buyanova, I. A. / Chen, W. M. / Henry, A. / Ni, W. X. / Hansson, G. V. / Monemar, B.

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Check availability in my library

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Document information

Title:

Defect Formation and Recombination Processes in p-Type Modulation-Doped Si Epilayers

Contributors:

Buyanova, I. A. (author) / Chen, W. M. (author) / Henry, A. (author) / Ni, W. X. (author) / Hansson, G. V. (author) / Monemar, B. (author)

Published in:

MATERIALS SCIENCE FORUM ; 479-484

Publication date:

1995-01-01

Size:

6 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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