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Oxygen precipitates in annealed CZ silicon wafers detected by SIRM and FTIR spectroscopy
Oxygen precipitates in annealed CZ silicon wafers detected by SIRM and FTIR spectroscopy
Oxygen precipitates in annealed CZ silicon wafers detected by SIRM and FTIR spectroscopy
Veve, C. (author) / Stemmer, M. (author) / Martinuzzi, S. (author)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 36 ; 200-203
1996-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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