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    Determination of the topmost atomic layer of NdBa~2Cu~3O~y thin films by developed total reflection angle X-ray spectroscopy (TRAXS)

    New search for: Liu, Z.
    New search for: Badaye, M.
    New search for: Ogota, S.
    New search for: Morishita, T.

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    Determination of the topmost atomic layer of NdBa~2Cu~3O~y thin films by developed total reflection angle X-ray spectroscopy (TRAXS)

    New search for: Liu, Z.
    New search for: Badaye, M.
    New search for: Ogota, S.
    New search for: Morishita, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Determination of the topmost atomic layer of NdBa~2Cu~3O~y thin films by developed total reflection angle X-ray spectroscopy (TRAXS)

    New search for: Liu, Z.
    New search for: Badaye, M.
    New search for: Ogota, S.
    New search for: Morishita, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Determination of the topmost atomic layer of NdBa~2Cu~3O~y thin films by developed total reflection angle X-ray spectroscopy (TRAXS)

    Contributors:

    Liu, Z. (author) / Badaye, M. (author) / Ogota, S. (author) / Morishita, T. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 115 ; 180-184

    Publication date:

    1997-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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