A platform for research: civil engineering, architecture and urbanism
Atomic layer deposition in traveling-wave reactor: In situ diagnostics by optical reflection
Atomic layer deposition in traveling-wave reactor: In situ diagnostics by optical reflection
Atomic layer deposition in traveling-wave reactor: In situ diagnostics by optical reflection
Rosental, A. (author) / Adamson, P. (author) / Gerst, A. (author) / Koppel, H. (author) / Tarre, A. (author)
APPLIED SURFACE SCIENCE ; 112 ; 82-86
1997-01-01
5 pages
Article (Journal)
English
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Monitoring of atomic layer deposition by incremental dielectric reflection
British Library Online Contents | 1996
|British Library Online Contents | 1997
|Surface of TiO"2 during atomic layer deposition as determined by incremental dielectric reflection
British Library Online Contents | 1999
|Novel materials by atomic layer deposition and molecular layer deposition
British Library Online Contents | 2011
|British Library Online Contents | 2010
|