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Real-time monitoring and control during MBE growth of GaAs/AlGaAs Bragg reflectors using multi-wavelength ellipsometry
Real-time monitoring and control during MBE growth of GaAs/AlGaAs Bragg reflectors using multi-wavelength ellipsometry
Real-time monitoring and control during MBE growth of GaAs/AlGaAs Bragg reflectors using multi-wavelength ellipsometry
Johs, B. (author) / Herzinger, C. (author) / He, P. (author) / Pittal, S. (author) / Woollam, J. (author) / Wagner, T. (author) / Jantz, W. / Baeumler, M.
1997-01-01
5 pages
Article (Journal)
English
DDC:
620.11
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