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Analysis of GaAs/SiN interface states and hot carrier annealing effects in GaAs MESFET
Analysis of GaAs/SiN interface states and hot carrier annealing effects in GaAs MESFET
Analysis of GaAs/SiN interface states and hot carrier annealing effects in GaAs MESFET
Sasaki, H. (author) / Hayashi, K. (author) / Fujioka, T. (author) / Mizuguchi, K. (author) / Osaki, T. (author) / Sugahara, K. (author) / Konishi, R. (author) / Kasada, H. (author) / Ando, K. (author)
APPLIED SURFACE SCIENCE ; 117/118 ; 729-734
1997-01-01
6 pages
Article (Journal)
English
DDC:
621.35
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