Structural Characterization of Thin Films by X-Ray Diffraction and Reflectivity: Fid-Bau Portal

Structural Characterization of Thin Films by X-Ray Diffraction and Reflectivity

Brower, D. T. / Medower, B. S. / Huang, T. C.

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Structural Characterization of Thin Films by X-Ray Diffraction and Reflectivity

Brower, D. T. / Medower, B. S. / Huang, T. C.

Structural Characterization of Thin Films by X-Ray Diffraction and Reflectivity

Brower, D. T. / Medower, B. S. / Huang, T. C.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Structural Characterization of Thin Films by X-Ray Diffraction and Reflectivity

Contributors:

Brower, D. T. (author) / Medower, B. S. (author) / Huang, T. C. (author)

Published in:

ADVANCES IN X RAY ANALYSIS ; 615-626

Publication date:

1997-01-01

Size:

12 pages

ISSN:

0376-0308

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 539.7222

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