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Defect Profiling with Low Energy Positrons of Nitrogen Implanted Silicon

Van der Werf, D. P. / Saleh, A. S. / Towner, A. / Nathwani, M. / Taylor, J. / Rice-Evans, P. C. / Bull, S. J.

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Defect Profiling with Low Energy Positrons of Nitrogen Implanted Silicon

Van der Werf, D. P. / Saleh, A. S. / Towner, A. / Nathwani, M. / Taylor, J. / Rice-Evans, P. C. / Bull, S. J.

Defect Profiling with Low Energy Positrons of Nitrogen Implanted Silicon

Van der Werf, D. P. / Saleh, A. S. / Towner, A. / Nathwani, M. / Taylor, J. / Rice-Evans, P. C. / Bull, S. J.

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Title:

Defect Profiling with Low Energy Positrons of Nitrogen Implanted Silicon

Contributors:

Van der Werf, D. P. (author) / Saleh, A. S. (author) / Towner, A. (author) / Nathwani, M. (author) / Taylor, J. (author) / Rice-Evans, P. C. (author) / Bull, S. J. (author) / Jean, Y. C. / Eldrup, M. / Schrader, D. M.

Published in:

Positron Annihilation ICPA-11 ; 500-502

MATERIALS SCIENCE FORUM ; 255/257

Publication date:

1997-01-01

Size:

3 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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