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    Evolution of Defect Profiles in He-Implanted Silicon Studied by Slow Positrons

    New search for: Brusa, R. S.
    New search for: Karwasz, G. P.
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    Evolution of Defect Profiles in He-Implanted Silicon Studied by Slow Positrons

    New search for: Brusa, R. S.
    New search for: Karwasz, G. P.
    New search for: Tiengo, N.
    New search for: Zecca, A.
    New search for: Corni, F.
    New search for: Nobili, C.
    New search for: Ottaviani, G.
    New search for: Tonini, R.
    New search for: Jean, Y. C.
    New search for: Eldrup, M.
    New search for: Schrader, D. M.
    New search for: West, R. N.

    Access

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    Evolution of Defect Profiles in He-Implanted Silicon Studied by Slow Positrons

    New search for: Brusa, R. S.
    New search for: Karwasz, G. P.
    New search for: Tiengo, N.
    New search for: Zecca, A.
    New search for: Corni, F.
    New search for: Nobili, C.
    New search for: Ottaviani, G.
    New search for: Tonini, R.
    New search for: Jean, Y. C.
    New search for: Eldrup, M.
    New search for: Schrader, D. M.
    New search for: West, R. N.

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    Document information
    Title:

    Evolution of Defect Profiles in He-Implanted Silicon Studied by Slow Positrons

    Contributors:

    Brusa, R. S. (author) / Karwasz, G. P. (author) / Tiengo, N. (author) / Zecca, A. (author) / Corni, F. (author) / Nobili, C. (author) / Ottaviani, G. (author) / Tonini, R. (author) / Jean, Y. C. / Eldrup, M.

    Published in:

    Positron Annihilation ICPA-11 ; 665-667

    MATERIALS SCIENCE FORUM ; 255/257

    Publication date:

    1997-01-01

    Size:

    3 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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