Characterization of Power MESFETs on 4H-SiC Conductive and Semi-Insulating Wafers: Fid-Bau Portal

Characterization of Power MESFETs on 4H-SiC Conductive and Semi-Insulating Wafers

Noblanc, O. / Arnodo, C. / Chartier, E. / Brylinski, C.

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Characterization of Power MESFETs on 4H-SiC Conductive and Semi-Insulating Wafers

Noblanc, O. / Arnodo, C. / Chartier, E. / Brylinski, C.

Characterization of Power MESFETs on 4H-SiC Conductive and Semi-Insulating Wafers

Noblanc, O. / Arnodo, C. / Chartier, E. / Brylinski, C.

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Check availability in my library

Order at Subito €

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Document information

Title:

Characterization of Power MESFETs on 4H-SiC Conductive and Semi-Insulating Wafers

Contributors:

Noblanc, O. (author) / Arnodo, C. (author) / Chartier, E. (author) / Brylinski, C. (author)

Published in:

MATERIALS SCIENCE FORUM ; 264/268 ; 949-952

Publication date:

1998-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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