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Growth and Characterization of SiC Films on Large-Area Si Wafers by APCVD - Temperature Dependence
Growth and Characterization of SiC Films on Large-Area Si Wafers by APCVD - Temperature Dependence
Growth and Characterization of SiC Films on Large-Area Si Wafers by APCVD - Temperature Dependence
Wu, C.-H. (author) / Fleischman, A. J. (author) / Zorman, C. A. (author) / Mehregany, M. (author) / Pensl, G. / Morkoc, H. / Monemar, B. / Janzen, E.
1998-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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