High Resolution X-Ray Diffraction Characterization of [111]B Oriented InGaAs/GaAs MQW Structures: Fid-Bau Portal

High Resolution X-Ray Diffraction Characterization of [111]B Oriented InGaAs/GaAs MQW Structures

Sanz-Hervas, A. / Sacedon, A. / Abril, E. J. / Sanchez-Rojas, J. L. / Villar, C. / DeBenito, G. / Aguilar, M. / Lopez, M. / Calleja, E. / Mu�oz, W.

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High Resolution X-Ray Diffraction Characterization of [111]B Oriented InGaAs/GaAs MQW Structures

Sanz-Hervas, A. / Sacedon, A. / Abril, E. J. / Sanchez-Rojas, J. L. / Villar, C. / DeBenito, G. / Aguilar, M. / Lopez, M. / Calleja, E. / Mu�oz, W.

High Resolution X-Ray Diffraction Characterization of [111]B Oriented InGaAs/GaAs MQW Structures

Sanz-Hervas, A. / Sacedon, A. / Abril, E. J. / Sanchez-Rojas, J. L. / Villar, C. / DeBenito, G. / Aguilar, M. / Lopez, M. / Calleja, E. / Mu�oz, W.

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Title:

High Resolution X-Ray Diffraction Characterization of [111]B Oriented InGaAs/GaAs MQW Structures

Contributors:

Sanz-Hervas, A. (author) / Sacedon, A. (author) / Abril, E. J. (author) / Sanchez-Rojas, J. L. (author) / Villar, C. (author) / DeBenito, G. (author) / Aguilar, M. (author) / Lopez, M. (author) / Calleja, E. (author) / Mu�oz, W. (author)

Published in:

ADVANCES IN X RAY ANALYSIS ; 439-448

Publication date:

1997-01-01

Size:

10 pages

ISSN:

0376-0308

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 539.7222

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