Characterization of SiC Epitaxial Structures using High-Resolution X-Ray Diffraction Techniques: Fid-Bau Portal

Characterization of SiC Epitaxial Structures using High-Resolution X-Ray Diffraction Techniques

Huang, X. R. / Dudley, M. / Cho, W. / Okojie, R. S. / Neudeck, P. G.

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Characterization of SiC Epitaxial Structures using High-Resolution X-Ray Diffraction Techniques

Huang, X. R. / Dudley, M. / Cho, W. / Okojie, R. S. / Neudeck, P. G.

Characterization of SiC Epitaxial Structures using High-Resolution X-Ray Diffraction Techniques

Huang, X. R. / Dudley, M. / Cho, W. / Okojie, R. S. / Neudeck, P. G.

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Check availability in my library

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Document information

Title:

Characterization of SiC Epitaxial Structures using High-Resolution X-Ray Diffraction Techniques

Contributors:

Huang, X. R. (author) / Dudley, M. (author) / Cho, W. (author) / Okojie, R. S. (author) / Neudeck, P. G. (author)

Published in:

MATERIALS SCIENCE FORUM ; 457/460 ; 157-162

Publication date:

2004-01-01

Size:

6 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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