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Characterization of semiconductor structures by high resolution X-ray diffraction

Sanz-Hervas, A. / Abril, E. J. / Paz, D. I. / De Benito, G.

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Characterization of semiconductor structures by high resolution X-ray diffraction

Sanz-Hervas, A. / Abril, E. J. / Paz, D. I. / De Benito, G.

Characterization of semiconductor structures by high resolution X-ray diffraction

Sanz-Hervas, A. / Abril, E. J. / Paz, D. I. / De Benito, G.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Characterization of semiconductor structures by high resolution X-ray diffraction

Contributors:

Sanz-Hervas, A. (author) / Abril, E. J. (author) / Paz, D. I. (author) / De Benito, G. (author)

Published in:

MATERIALS SCIENCE AND TECHNOLOGY -LONDON- ; 11 ; 72

Publication date:

1995-01-01

Size:

72 pages

ISSN:

0267-0836

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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