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Residual Stress Evolution by the ex-situ Annealing of TiN Thin Films Deposited on Steel Substrates
Residual Stress Evolution by the ex-situ Annealing of TiN Thin Films Deposited on Steel Substrates
Residual Stress Evolution by the ex-situ Annealing of TiN Thin Films Deposited on Steel Substrates
Ye, M. (author) / Berton, G. (author) / Delplancke, J. L. (author) / Delplancke, M. P. (author) / Segers, L. (author) / Winand, R. (author) / De Bruyn, K. (author)
MATERIALS SCIENCE FORUM ; 287/288 ; 275-280
1998-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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