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    Application of focused ion beam (FIB) microscopy to the study of crack profiles

    New search for: Wang, Y.-Z.
    New search for: Revie, R. W.
    New search for: Phaneuf, M. W.
    New search for: Li, J.

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    Application of focused ion beam (FIB) microscopy to the study of crack profiles

    New search for: Wang, Y.-Z.
    New search for: Revie, R. W.
    New search for: Phaneuf, M. W.
    New search for: Li, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Application of focused ion beam (FIB) microscopy to the study of crack profiles

    New search for: Wang, Y.-Z.
    New search for: Revie, R. W.
    New search for: Phaneuf, M. W.
    New search for: Li, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Application of focused ion beam (FIB) microscopy to the study of crack profiles

    Contributors:

    Wang, Y.-Z. (author) / Revie, R. W. (author) / Phaneuf, M. W. (author) / Li, J. (author)

    Published in:

    FATIGUE AND FRACTURE OF ENGINEERING MATERIALS AND STRUCTURES ; 22 ; 251-256

    Publication date:

    1999-01-01

    Size:

    6 pages

    ISSN:

    8756-758X

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1123

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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