Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Application of focused ion beam (FIB) microscopy to the study of crack profiles
Application of focused ion beam (FIB) microscopy to the study of crack profiles
Application of focused ion beam (FIB) microscopy to the study of crack profiles
Wang, Y.-Z. (Autor:in) / Revie, R. W. (Autor:in) / Phaneuf, M. W. (Autor:in) / Li, J. (Autor:in)
FATIGUE AND FRACTURE OF ENGINEERING MATERIALS AND STRUCTURES ; 22 ; 251-256
01.01.1999
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.1123
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