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Microstructural studies by transmission electron microscopy of the formation of ultrathin PtSi layers with novel silicidation processes
Microstructural studies by transmission electron microscopy of the formation of ultrathin PtSi layers with novel silicidation processes
Microstructural studies by transmission electron microscopy of the formation of ultrathin PtSi layers with novel silicidation processes
Jin, S. (Autor:in) / Bender, H. (Autor:in) / Donaton, R. A. (Autor:in) / Maex, K. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 14 ; 2577-2587
01.01.1999
11 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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