Effects of thermal annealing on the strains and structures of CdTe epilayers grown on Si(100) substrates for various substrate tilt angles: Fid-Bau Portal

Effects of thermal annealing on the strains and structures of CdTe epilayers grown on Si(100) substrates for various substrate tilt angles

Hou, Y.B. / Leem, J.H. / Kang, T.W. / Kim, T.W.

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Effects of thermal annealing on the strains and structures of CdTe epilayers grown on Si(100) substrates for various substrate tilt angles

Hou, Y.B. / Leem, J.H. / Kang, T.W. / Kim, T.W.

Effects of thermal annealing on the strains and structures of CdTe epilayers grown on Si(100) substrates for various substrate tilt angles

Hou, Y.B. / Leem, J.H. / Kang, T.W. / Kim, T.W.

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Check availability in my library

Order at Subito €

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Document information

Title:

Effects of thermal annealing on the strains and structures of CdTe epilayers grown on Si(100) substrates for various substrate tilt angles

Contributors:

Hou, Y.B. (author) / Leem, J.H. (author) / Kang, T.W. (author) / Kim, T.W. (author)

Published in:

APPLIED SURFACE SCIENCE ; 151 ; 213-217

Publication date:

1999-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

Hou, Y. B. / Leem, J. H. / Kang, T. W. et al. | British Library Online Contents | 1999

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