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Raman and X-ray photoelectron spectroscopy study of carbon nitride thin films

Petrov, P. / Dimitrov, D.B. / Papadimitriou, D. / Beshkov, G. / Krastev, V. / Georgiev, C.

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Raman and X-ray photoelectron spectroscopy study of carbon nitride thin films

Petrov, P. / Dimitrov, D.B. / Papadimitriou, D. / Beshkov, G. / Krastev, V. / Georgiev, C.

Raman and X-ray photoelectron spectroscopy study of carbon nitride thin films

Petrov, P. / Dimitrov, D.B. / Papadimitriou, D. / Beshkov, G. / Krastev, V. / Georgiev, C.

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Document information

Title:

Raman and X-ray photoelectron spectroscopy study of carbon nitride thin films

Contributors:

Petrov, P. (author) / Dimitrov, D.B. (author) / Papadimitriou, D. (author) / Beshkov, G. (author) / Krastev, V. (author) / Georgiev, C. (author)

Published in:

APPLIED SURFACE SCIENCE ; 151 ; 233-238

Publication date:

1999-01-01

Size:

6 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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