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In situ transmission electron microscopy investigation of threading dislocation motion in passivated thin aluminum films

Keller-Flaig, R.-M. / Legros, M. / Sigle, W. / Gouldstone, A. / Hemker, K. J. / Suresh, S. / Arzt, E.

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In situ transmission electron microscopy investigation of threading dislocation motion in passivated thin aluminum films

Keller-Flaig, R.-M. / Legros, M. / Sigle, W. / Gouldstone, A. / Hemker, K. J. / Suresh, S. / Arzt, E.

In situ transmission electron microscopy investigation of threading dislocation motion in passivated thin aluminum films

Keller-Flaig, R.-M. / Legros, M. / Sigle, W. / Gouldstone, A. / Hemker, K. J. / Suresh, S. / Arzt, E.

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Check availability in my library

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Document information

Title:

In situ transmission electron microscopy investigation of threading dislocation motion in passivated thin aluminum films

Contributors:

Keller-Flaig, R.-M. (author) / Legros, M. (author) / Sigle, W. (author) / Gouldstone, A. (author) / Hemker, K. J. (author) / Suresh, S. (author) / Arzt, E. (author)

Published in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 14 ; 4673-4676

Publication date:

1999-01-01

Size:

4 pages

ISSN:

0884-2914

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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