Optical characterization of polycrystalline ZnSe1−xTex thin films using variable angle spectroscopic ellipsometry and spectrophotmetery techniques: Fid-Bau Portal

Optical characterization of polycrystalline ZnSe1−xTex thin films using variable angle spectroscopic ellipsometry and spectrophotmetery techniques

Shaaban, E.R. / El-Hagary, M. / Emam-Ismail, M. / Abd Elnaeim, A.M. / Moustafa, S.H. / Adel, A.

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Optical characterization of polycrystalline ZnSe1−xTex thin films using variable angle spectroscopic ellipsometry and spectrophotmetery techniques

Shaaban, E.R. / El-Hagary, M. / Emam-Ismail, M. / Abd Elnaeim, A.M. / Moustafa, S.H. / Adel, A.

Optical characterization of polycrystalline ZnSe1−xTex thin films using variable angle spectroscopic ellipsometry and spectrophotmetery techniques

Shaaban, E.R. / El-Hagary, M. / Emam-Ismail, M. / Abd Elnaeim, A.M. / Moustafa, S.H. / Adel, A.

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Document information

Title:

Optical characterization of polycrystalline ZnSe1−xTex thin films using variable angle spectroscopic ellipsometry and spectrophotmetery techniques

Contributors:

Shaaban, E.R. (author) / El-Hagary, M. (author) / Emam-Ismail, M. (author) / Abd Elnaeim, A.M. (author) / Moustafa, S.H. (author) / Adel, A. (author)

Published in:

Materials science in semiconductor processing ; 39 ; 735-741

Publication date:

2015-01-01

Size:

7 pages

ISSN:

1369-8001

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.38152

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